Standard ICT Test Probes - 100mil - Crown (CA, CB, CC, CG)

from NZD 2.80

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact. the CG version has a multipoint tip and can be used in a wide range of applications. The CC version of the pin is also self cleaning.

Tip Diameter (mm):
Tip Type:
Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact. the CG version has a multipoint tip and can be used in a wide range of applications. The CC version of the pin is also self cleaning.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for PCBs that have been manufactured with bead probe technology

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

ST1000 Test Pin Specification
Crown Tip Details
Spring Force Detail
Download Test Probes Catalogue (Ref Page 28)

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