Standard ICT Test Probes - 100mil - Flat Tip (FA)

from NZD 2.86

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Passive Flat Tip (FA) has a smooth surface and leaves no mark on the Test Pads after test.

Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Passive Flat Tip (FA) has a smooth surface and leaves no mark on the Test Pads after test.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for PCBs that have been manufactured with bead probe technology

Tip Diameter

  • FA: 1.5mm

Technical Specifications

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

Download Datasheet
Download Test Probes Catalogue (Ref Page 28)