Standard ICT Test Probes - 100mil - Detector Tip (DC)

NZD 4.65

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The DC Tip has a plastic Cup around a Serrated Crown and is designed for component Presence Check.

Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The DC Tip has a plastic Cup around a Serrated Crown and is designed for component Presence Check.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for PCBs that have been manufactured and require component presence checks

Tip Diameter

  • DC: 2.25mm

Technical Specifications

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

Download Datasheet
Download Test Probes Catalogue (Ref Page 28)