Standard ICT Test Probes - 100mil - Detector Tip (DC)
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The DC Tip has a plastic Cup around a Serrated Crown and is designed for component Presence Check.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The DC Tip has a plastic Cup around a Serrated Crown and is designed for component Presence Check.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The DC Tip has a plastic Cup around a Serrated Crown and is designed for component Presence Check.
Key Features -
High contact accuracy
Long life expectancy
Typical Applications -
ICT Test Fixtures for PCBs that have been manufactured and require component presence checks
Tip Diameter
DC: 2.25mm
Technical Specifications
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.
