Standard ICT Test Probes - 100mil - Engraver (EC, ER )

from NZD 2.80

These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Engraver Tip on theEC and ER versions provide a tri sided tip for use with Open Via’s and test pads and have three contacting edges .

Tip Type:
Spring Force:

These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Engraver Tip on theEC and ER versions provide a tri sided tip for use with Open Via’s and test pads and have three contacting edges .

Key Features -

  • High contact accuracy

  • Long life expectancy

Tip Diameter

  • EC 0.91mm

  • ER 1.5mm

Typical Applications -

  • ICT Test Fixtures for PCBs that have been manufactured requiring probing of open vias. These probes typically have an aggressive tip type.

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

ST1000 Test Pin Specification
Spring Force Detail
Download Test Probes Catalogue (Ref Page 28)