Standard ICT Test Probes - 75mil - Spider (SG)

NZD 3.41

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 8 blade tip on the SG version is suitable for contaminated test pin contacting.

Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 8 blade tip on the SG version is suitable for contaminated test pin contacting.

Key Features -

  • High contact accuracy

  • Long life expectancy

Tip Diameter:

  • SG 1.2mm

Typical Applications -

  • ICT Test Fixtures for PCBs that have been manufactured with bead or contaminated test pins

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

You Might Also Like