Standard ICT Test Probes - 75mil - Spider (SG)

NZD 3.41

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 8 blade tip on the SG version is suitable for contaminated test pin contacting.

Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 8 blade tip on the SG version is suitable for contaminated test pin contacting.

Key Features -

  • High contact accuracy

  • Long life expectancy

Tip Diameter:

  • SG 1.2mm

Typical Applications -

  • ICT Test Fixtures for PCBs that have been manufactured with bead or contaminated test pins

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

ST750 Test Pin Specification
ST750mSpring Force Detail
Download Test Probes Catalogue (Ref Page 28)

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