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Automated Test Equipment Products and Components Standard ICT Test Probes - 75mil - Hexagonal (HK)
HK Tip Application.png Image 1 of 2
HK Tip Application.png
ST750 HK Tip Details .png Image 2 of 2
ST750 HK Tip Details .png
HK Tip Application.png
ST750 HK Tip Details .png

Standard ICT Test Probes - 75mil - Hexagonal (HK)

NZD 3.41

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Hexagonal Tip (HK) has 6 shaped edges which are used open via contacts.

Spring Force:
Quantity:
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These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Hexagonal Tip (HK) has 6 shaped edges which are used open via contacts.

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Hexagonal Tip (HK) has 6 shaped edges which are used open via contacts.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for where probing open vias and Test Pads

Tip Diameter

  • HK: 1.2mm


Technical Specification 

Mechanical
CENTERS - PITCH
2.54mm / 0.100"
RECOMMENDED WORKING STROKE
4.30mm / 0.169"
FULL STROKE
6.35mm / 0.250"
Electrical
MAX CURRENT
3 - 4A (continuous)
AVG RESISTANCE
<20 mΩ

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.


ST750 Test Pin Specification
ST750mSpring Force Detail
Download Test Probes Catalogue (Ref Page 28)

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