Standard ICT Test Probes - 75mil - Taper (TA)

NZD 3.41

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.

Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for PCBs where connection to Wire Wrap or Connector pins

Tip Diameter

  • TA: 1.2mm

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

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