Standard ICT Test Probes - 75mil - Taper (TA)

NZD 3.41

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.

Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for PCBs where connection to Wire Wrap or Connector pins

Tip Diameter

  • TA: 1.2mm

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

ST750 Test Pin Specification
ST750 Spring Force Code
Download Test Probes Catalogue (Ref Page 34)

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