Standard ICT Test Probes - 75mil - Taper (TA)
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Taper Tips (TA) are suitable for connecting to Wire Wrap post and connector pins.
Key Features -
High contact accuracy
Long life expectancy
Typical Applications -
ICT Test Fixtures for PCBs where connection to Wire Wrap or Connector pins
Tip Diameter
TA: 1.2mm
Technical Specification
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.
