Standard ICT Test Probes - 75mil - Crown (CA, CB, CC)

from NZD 3.28

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact with the CC version of the tip being self cleaning.

Tip Diameter (mm):
Tip Type:
Spring Force:

These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact with the CC version of the tip being self cleaning.

Key Features -

  • High contact accuracy

  • Long life expectancy

Typical Applications -

  • ICT Test Fixtures for PCBs where connection to Component pins

Technical Specification 

Delivery: Stock items despatched within 1 to 2 days from date of Order

Non Stock Items despatched approximately 2 weeks from date of order

Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.

ST750 Test Pin Specification
ST750 Spring Force Code
Download Test Probes Catalogue (Ref Page 34)

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