Standard ICT Test Probes - 75mil - Lead Free (LA, LB, LC)
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Lead Free Tip on the LA, LB and LC versions provided dagger tips of different profiles for use with Lead Free Solder materials.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Lead Free Tip on the LA, LB and LC versions provided dagger tips of different profiles for use with Lead Free Solder materials.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Lead Free Tip on the LA, LB and LC versions provided dagger tips of different profiles for use with Lead Free Solder materials.
Key Features -
High contact accuracy
Long life expectancy
Typical Applications -
ICT Test Fixtures for PCBs for use with Lead Free Solder materials.
Tip Diameter
LA, LB, LC: 0.64mm
Technical Specification
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.
